OXFORD INSTRUMENTS POLY-S HIGH PERFORMANCE XRF SAMPLE FILM 100M, 3.5MICRON, P/N: L74

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The Oxford Instruments Poly-S XRF Sample Film (P/N: L74) is a high-clarity, contamination-free polymer film engineered for superior X-Ray Fluorescence analysis. With a 3.5 micron thickness and 100m roll length, it provides high transmission efficiency, excellent chemical resistance, and improved signal accuracy for precise elemental measurements.

Price:

$15,00

The Oxford Instruments Poly-S High-Performance XRF Sample Film is specifically designed for laboratories requiring maximum sensitivity and minimal interference in X-Ray Fluorescence spectroscopy. Manufactured with ultra-clean polymeric materials, this film offers exceptional purity and low background noise, enhancing the detection of trace elements.

With a 3.5 micron thin profile, the Poly-S film ensures strong X-ray transmission while maintaining structural integrity under pressure. The 100-meter roll format allows efficient sample preparation, cost-effective usage, and compatibility with automated and benchtop XRF systems.

This product is widely used in:

  • Mining & geological sample testing

  • Metallurgical analysis

  • Petrochemical QC laboratories

  • Environmental testing

  • Research & academic facilities

Engineered for durability and chemical resistance, it prevents sample contamination, resists wrinkling, and maintains stability under varying conditions — ensuring repeatable, reliable analytical results.


Key Features

  • Ultra-thin 3.5 micron polymer film

  • Low background interference

  • High X-ray transmission efficiency

  • Chemically resistant surface

  • Tear-resistant for secure sample handling

  • Minimizes sample contamination

  • Suitable for high-precision trace analysis


Technical Specifications

  • Material: High-performance polymer film

  • Thickness: 3.5 micron

  • Roll Length: 100 m

  • Part Number: L74

  • High purity, low-noise construction


Applications

  • XRF sample preparation

  • Liquid and powdered sample containment

  • Precision analytical workflows

  • Trace element monitoring


Benefits

  • Improved detection sensitivity

  • Lower analytical background

  • Increased throughput and efficiency

  • Reduced sample loss or leakage

  • Compatible with wide-range XRF systems